The Seventeenth Asian Test Symposium General Information
SPONSORS
- IEEE Computer Society, Test Technology Technical Council
- The IEICE Information and Systems Society, Technical Committee on DC
- Kyushu Institute of Technology
SUPPORTERS
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SCOPE
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.
Topics of interest include, but are not limited to:
- Automatic Test Generation / Fault Simulation
- Design for Testability / Synthesis for Testability
- Built-In Self-Test / Test Data Compression
- Delay Testing
- Defect-Based Testing / IDDX Testing
- Power Issues in Test
- Fault Modeling & Diagnosis
- Memory Test / FPGA Test
- Analog and Mixed-Signal Test
- RF Testing / High-Speed I/O Test
- System-on-a-Chip Test
- Board and System Test
- Network Protocol Testing
- Design Verification and Validation
- On-Line Test
- Fault Tolerance / Dependable System
- Software Testing / Software Design for Testing
- Economics of Test
KEY DATES
Ealry Registration: Oct. 24th, 2008.
MORE INFORMATION
For general information
General Co-Chairs:
Yasuo Sato and Seiji Kajihara
(ats08-gc@dsgn.im.hiroshima-cu.ac.jp)
For submission related information
Program Chair:
Kazumi Hatayama
(ats08-pc@dsgn.im.hiroshima-cu.ac.jp)
For industry session information
Industry Chair: Toshinobu Ono
(ats08-ic@dsgn.im.hiroshima-cu.ac.jp)