The Seventeenth Asian Test Symposium (ATS 2008)

WRTLT'08
11/24 (Mon.)	9:00-12:00	Tutorial 1
	13:30-16:30	Tutorial 2
	18:00-20:00	Welcome Reception
11/25 (Tue.)	9:00-10:15	Plenary Session 1
	10:15-10:45	Coffee Break
	10:45-12:00	Plenary Session 2
	12:00-13:30	Lunch Time
	13:30-14:45	3A: Test Data & Response Compression	3B: Test Generation and Fault Simulation	3C: RF Testing
	14:45-15:15	Coffee Break
	15:15-16:30	4A: Test Compression and BIST	4B: Test Generation for Physical Faults	4C: Analog and Mixed-Signal Test
	17:00-20:30	Social Event (Sapporo Beer Garden)
11/26 (Wed.)	9:00-10:15	5A: Delay Testing	5B: Analog Production Test 1	5C: Hybrid Method for Test Data Compression
	10:15-10:45	Coffee Break
	10:45-12:00	6A: Fault Diagnosis	6B: Analog Production Test 2	6C: Defect Based Testing
	12:00-13:30	Lunch Time
	13:30-14:45	7A: Panel Session	7B: Power Aware Test Generation	7C: Design for Efficient Test
	14:45-15:15	Coffee Break
	15:15-17:00	8A: Industry Session	8B: SoC Test	8C: Design Verification and Validation
	17:00-17:45	Poster Session (Foyer)
	18:00-20:00	Banquet
11/27 (Thu.)	9:00-10:15	9A: Power Aware Scan Test	9B: Memory Self Test	9C: On-Line Test
	10:15-10:45	Coffee Break
	10:45-12:00	10A: Power Aware Delay Testing	10B: Advanced Memory Test	10C: Fault Tolerance and Dependable System

ATS'08